{"id":917,"date":"2024-12-10T13:19:05","date_gmt":"2024-12-10T04:19:05","guid":{"rendered":"https:\/\/www.katsura-opto.com\/?post_type=case&#038;p=917"},"modified":"2025-04-18T14:57:48","modified_gmt":"2025-04-18T05:57:48","slug":"semiconductor-03","status":"publish","type":"case","link":"https:\/\/www.katsura-opto.com\/en\/case\/semiconductor-03","title":{"rendered":"Non-contact measurement of dallision(roll-off) at the periphery of semiconductor wafers"},"content":{"rendered":"\n<div class=\"wp-block-columns is-layout-flex wp-container-core-columns-is-layout-9d6595d7 wp-block-columns-is-layout-flex\">\n<div class=\"wp-block-column is-layout-flow wp-block-column-is-layout-flow\">\n<figure class=\"wp-block-image size-full\"><img decoding=\"async\" width=\"716\" height=\"478\" src=\"https:\/\/www.katsura-opto.com\/wp-content\/uploads\/2024\/10\/003-1_we-ha.png\" alt=\"Non-contact measurement of dallision(roll-off) at the periphery of semiconductor wafers\" class=\"wp-image-440\" srcset=\"https:\/\/www.katsura-opto.com\/wp-content\/uploads\/2024\/10\/003-1_we-ha.png 716w, https:\/\/www.katsura-opto.com\/wp-content\/uploads\/2024\/10\/003-1_we-ha-300x200.png 300w\" sizes=\"(max-width: 716px) 100vw, 716px\" \/><\/figure>\n<\/div>\n\n\n\n<div class=\"wp-block-column is-layout-flow wp-block-column-is-layout-flow\">\n<figure class=\"wp-block-image size-full\"><img decoding=\"async\" width=\"732\" height=\"488\" src=\"https:\/\/www.katsura-opto.com\/wp-content\/uploads\/2024\/12\/003-2e_we-ha.png\" alt=\"Non-contact measurement of dallision(roll-off) at the periphery of semiconductor wafers\" class=\"wp-image-953\" srcset=\"https:\/\/www.katsura-opto.com\/wp-content\/uploads\/2024\/12\/003-2e_we-ha.png 732w, https:\/\/www.katsura-opto.com\/wp-content\/uploads\/2024\/12\/003-2e_we-ha-300x200.png 300w\" sizes=\"(max-width: 732px) 100vw, 732px\" \/><\/figure>\n<\/div>\n<\/div>\n\n\n\n<p class=\"has-red-color has-text-color has-link-color has-medium-font-size wp-elements-fdfd8f7cc827a72fd42741283006935e\"><strong>\u30fbIssues<\/strong><\/p>\n\n\n\n<p>We would like to evaluate roll-off variation in the periphery of semiconductor wafers in a non-contact manner.<\/p>\n\n\n\n<p class=\"has-green-color has-text-color has-link-color has-medium-font-size wp-elements-014c0840d496b86729c1eb58a9e71089\"><strong>\u30fbSolutions<\/strong><\/p>\n\n\n\n<p>Tilt sensor enables non-contact measurement of the angle of the semiconductor wafer tip to measure the roll-off at the tip of the wafer. This leads to improved yield and productivity.<\/p>\n\n\n\n<p><\/p>\n","protected":false},"author":2,"featured_media":440,"template":"","meta":{"_acf_changed":true,"_locale":"en_US","_original_post":"https:\/\/www.katsura-opto.com\/?post_type=case&#038;p=124"},"case-cat":[8],"case-tag":[26,17],"class_list":["post-917","case","type-case","status-publish","has-post-thumbnail","hentry","case-cat-semiconductor","case-tag-26","case-tag-17","en-US"],"acf":[],"_links":{"self":[{"href":"https:\/\/www.katsura-opto.com\/wp-json\/wp\/v2\/case\/917","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.katsura-opto.com\/wp-json\/wp\/v2\/case"}],"about":[{"href":"https:\/\/www.katsura-opto.com\/wp-json\/wp\/v2\/types\/case"}],"author":[{"embeddable":true,"href":"https:\/\/www.katsura-opto.com\/wp-json\/wp\/v2\/users\/2"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.katsura-opto.com\/wp-json\/wp\/v2\/media\/440"}],"wp:attachment":[{"href":"https:\/\/www.katsura-opto.com\/wp-json\/wp\/v2\/media?parent=917"}],"wp:term":[{"taxonomy":"case-cat","embeddable":true,"href":"https:\/\/www.katsura-opto.com\/wp-json\/wp\/v2\/case-cat?post=917"},{"taxonomy":"case-tag","embeddable":true,"href":"https:\/\/www.katsura-opto.com\/wp-json\/wp\/v2\/case-tag?post=917"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}